Optical Profilmeter
Interferometric optical profilometry is a non-contact surface measurement technique that utilizes light interference to assess surface topography with nanometer-level precision. This method is based on the principle of interferometry, where light waves reflected from the surface under investigation are combined with reference waves to create an interference pattern. The pattern encodes information about the surface's height variations.
The Bruker ContourGT-K system is a vertical benchtop optical surface-profiling system that can measure a wide variety of surfaces and samples. It measures surface topography with high accuracy in a range from fractions of a nm to approximately 10 mm. The device supports Vertical Scanning Interferometry (VSI) and Phase-Shifting Interferometry (PSI) measurements. The Vision64 software controls the instrument settings, data analyses, and graphical output.
Specification
Magnification
2.5x – Michelson interferometer with a working distance of 3.5 mm
10x – Mirau interferometer with a working distance of 7.4 mm
20x – Mirau interferometer with a working distance of 4.7 mm
Basic Measurement Modes
VSI measurement mode
PSI measurement mode
