Scanning probe microscopy (SPM)

Scanning Probe Microscopy (SPM) is a group microscopy techniues using a physical probe - a cantilever with a sharp tip. The Ntegra SPM microscope from NT-MDT Company provides high resolution scans of up to 50 x 50 μm of samples with a roughness of 1 μm or less, a chamber for High vacuum measurements and conductive needle tips for electic measurements.

Available analyses

  • AFM – Atomic Force Microscopy
  • EFM – Electric Force Microscopy
  • MFM – Magnetic Force Microscopy
  • Kelvin Probe
  • STM – Scanning Tunelling Microscopy
  • SSRM – Scanning Spreading Resistance Microscopy

Contact person

Michal Patrnčiak, Mgr.

PhD. Student