X-ray Photoelectron Spectroscopy (XPS)

Our multiprobe electron spectroscopy system offers a comprehensive suite of analytical techniques designed for detailed surface and material characterization. The setup integrates X-ray Photoelectron Spectroscopy (XPS), UV Photoelectron Spectroscopy (UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS), all operating in an ultra-high vacuum environment to ensure precise measurements. XPS and UPS analyze the electronic structure and chemical composition of surfaces by measuring the energy of electrons ejected under X-ray or UV light. UPS, in particular, is valuable for determining the band gap and other electrical properties of materials. AES provides elemental and chemical information through electron emission resulting from electron-induced energy transitions. ISS employs ionized particles to probe surface structure, offering sensitivity to the outermost atomic layers. This advanced system includes a scanning electron microscope for high-resolution imaging, an ion gun for depth profiling to investigate layer structures, and an electron charge neutralizer to facilitate studies on insulating materials. Together, these tools enable applications ranging from surface chemistry and thin-film analysis to defect characterization and material development, supporting cutting-edge research and industrial innovation.